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Enhanced Forming In Al-SiOx-Au Structures Under Pulsed Bias

R. Thurstans, P. Wild, D. Oxley
Published 1974 · Materials Science

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Abstract Larger peak currents have been observed under “single-shot” pulsed bias in electroformed Al-SiO x -Au structures. These are explained in terms of filamentary models. Continued application of pulses enhances this effect and modifies the subsequent d.c. characteristics of the device. It is suggested that these effects can only be explained in terms of filamentary models in which filaments are produced during pulsed operation.
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