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Comment On “Extent Of Conjugation In Diazonium-derived Layers In Molecular Junction Devices Determined By Experiment And Modelling” By C. Van Dyck, A. J. Bergren, V. Mukundan, J. A. Fereiro And G. A. DiLabio, Phys. Chem. Chem. Phys., 2019, 21, 16762

Richard L. McCreery, Shailendra K. Saxena, Mustafa Supur, Ushula M. Tefashe

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Misinterpretation of scanning tunnelling microscopy results and sampling error yielded incorrect conclusions about the flatness of a carbon electrode substrate used for molecular electronic devices.