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Reply To The ‘Comment On “Extent Of Conjugation In Diazonium-derived Layers In Molecular Junction Devices Determined By Experiment And Modelling”’ By R. L. McCreery, S. K. Saxena, M. Supur And U. Tefashe, Phys. Chem. Chem. Phys., 2020, 22, DOI: 10.1039/d0cp02412k
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By clarifying the degree of surface roughness on substrates used to grow molecular films, we show that it is helpful to refine the models used to describe these surfaces to include more structure details.