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Biased Surface Fluctuations Due To Current Stress.

O. Bondarchuk, W. Cullen, M. Degawa, E. D. Williams, T. Bole, P. Rous
Published 2007 · Materials Science, Medicine

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Direct correlation between temporal structural fluctuations and electron wind force is demonstrated, for the first time, by STM imaging and analysis of atomically resolved motion on a thin film surface under large applied current (10(5) A/cm2). The magnitude of the momentum transfer between current carriers and the geometrically constrained atoms in the fluctuating structure is at least 5x to 15x (+/-1sigma range) larger than for freely diffusing adatoms. Corresponding changes in surface resistivity will contribute significant fluctuation signature to nanoscale electronic properties.
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