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Surface Derivatization Of Nanoscale Tungsten Probes For Interfacial Force Microscopy

J. Graham, K. Griffiths, M. Kovár̆, P. R. Norton, F. Ogini, O. Warren
Published 1999 · Chemistry

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Interfacial force microscopy is a novel technique for imaging and quantitative determination of the mechanical properties of a material such as elastic modulus, hardness, etc., with nm spatial resolution and nN force resolution. Due to the extreme pressures generated during probe-surface contact (many GPa), passivation of the chemical interactions, specifically adhesion, between the parabaloidal tungsten probe tips (radii 35
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