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Film Thickness Dependence Of Microstructure And Superconductive Property Of PLD Prepared YBCO Layers

H. Zhang, Jian Yang, S. G. Wang, Yunyi Wu, Qinli Lv, S. Li
Published 2014 · Physics

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Abstract YBCO superconducting films in the range of 0.4–2.33 μm were deposited on CeO 2 /YSZ/Y 2 O 3 /NiW substrates by PLD, and the microstructure and electric property were investigated. The results show that the obtained YBCO films are predominantly c -axis oriented, though there are small NiO peaks. With the YBCO thickening, its surface quality decline, the amount of the a -axis grains and BaCeO 3 increase, and the in- and out-plane alignments of YBCO and CeO 2 become worse. The J c values degrade with the film thickening, which is only 1.2 MA/cm 2 (77 K, SF) when the thickness is 1.17 μm.
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