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Statistical Investigation Of The Length-dependent Deviations In The Electrical Characteristics Of Molecular Electronic Junctions Fabricated Using The Direct Metal Transfer Method

Hyunhak Jeong, Dongku Kim, Hyukwoo Kwon, Wang-Taek Hwang, Yeonsik Jang, Misook Min, Kookrin Char, Dong Xiang, Heejun Jeong, Takhee Lee

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