We describe bilayer structures comprised of a poly (p-phenylene vinylene) (PPV) layer and a trap-free diaryldiamine (TPD) doped in polycarbonate (PC) layer, sandwiched between indium-tin-oxide (ITO) and aluminum (Al) contacts. Two critical phenomena in the operation of polymer based electroluminescent devices, interface injection and carrier range, are investigated. It is established that the ITO/PPV contact is capable of sustaining dark current under trap-free space-charge-limited (TFSCL) conditions into a hole transporting TPD:PC layer. TFSCL currents are not observed in devices without the PPV layer. Upon increasing the thickness of the PPV layer a deviation from the TFSCL regime is observed which is attributed to trapping of the injected holes within PPV. These observations suggest a novel method for estimating the trapping Mobility-lifetime product μτ for holes in PPV. By this means we estimate μτ ∼ 10−9 cm2/V.